ATPG and Test Compression for Probabilistic Circuits
碩士 === 國立臺灣大學 === 電子工程學研究所 === 106 === Probabilistic circuits are gaining importance in the next generation ultra low-power computing and quantum computing. Unlike testing deterministic circuits, where each test pattern is applied only once, testing probabilistic circuits requires multiple pattern...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2018
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| Online Access: | http://ndltd.ncl.edu.tw/handle/2vm53r |