Development and Investigation of the Dual-gate Black Phosphorus Field-Effect Transistor

碩士 === 國立臺灣大學 === 電子工程學研究所 === 106 === In this paper, we propose a method to solve the interface problem that occurs in the channel and dielectric layer when making black phosphorus field-effect transistor. The main reason for the interface problem is that the black phosphorus lacks of dangling bond...

Full description

Bibliographic Details
Main Authors: Kai-Lin Fan, 范鎧麟
Other Authors: Chao-Hsin Wu
Format: Others
Language:en_US
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/uxj696