Mixed-Cell-Height Placement Considering Drain-to-Drain Abutment

碩士 === 國立臺灣大學 === 電子工程學研究所 === 106 === Along with device scaling, the drain-to-drain abutment (DDA) constraint arises as an emerging challenge in modern circuit designs, which incurs additional difficulties especially for designs with mixed-cell-height standard cells which have prevailed in advanced...

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Bibliographic Details
Main Authors: Yu-Wei Tseng, 曾育為
Other Authors: Yao-Wen Chang
Format: Others
Language:en_US
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/mn46dt