Mixed-Cell-Height Placement Considering Drain-to-Drain Abutment
碩士 === 國立臺灣大學 === 電子工程學研究所 === 106 === Along with device scaling, the drain-to-drain abutment (DDA) constraint arises as an emerging challenge in modern circuit designs, which incurs additional difficulties especially for designs with mixed-cell-height standard cells which have prevailed in advanced...
Main Authors: | Yu-Wei Tseng, 曾育為 |
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Other Authors: | Yao-Wen Chang |
Format: | Others |
Language: | en_US |
Published: |
2018
|
Online Access: | http://ndltd.ncl.edu.tw/handle/mn46dt |
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