Characterization and Memory Application of Ultrathin Oxide MOS Diodes in the Perspective of Capacitance

碩士 === 國立臺灣大學 === 電子工程學研究所 === 106 === The thesis studies the fringing field carrier coupling effect in the view point of capacitance characteristics. A two capacitance states operation is proposed and demonstrated to have memory behavior. It is known that the carriers of adjacent devices would int...

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Bibliographic Details
Main Authors: Hao-Jyun Li, 黎鎬均
Other Authors: Jenn-Gwo Hwu
Format: Others
Language:en_US
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/nfx93v