A Fast and Accurate Multilevel Delay Fault Simulator for Software-based Self-Testing
碩士 === 國立臺灣大學 === 電子工程學研究所 === 106 === Due to technology scaling, the reliability issue in modern CPU is increasingly important and is widely discussed since aging effect can affect transistor performance after decades. In order to detect aging-induced delay faults, at-speed software-based self-test...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2018
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| Online Access: | http://ndltd.ncl.edu.tw/handle/8uwtyr |