Thermal Fatigue Life and Reliability Evaluation of Insulated Gate Bipolar Transistor under JEDEC-Specified Thermal Cycling
碩士 === 國立臺灣大學 === 機械工程學研究所 === 106 === In recent years, new-energy vehicles and wind power industry have developed rapidly. To provide high power-density and current for those applications, the reliability of insulated gate bipolar transistor (IGBT) modules have also become an important issue. In fa...
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| Format: | Others |
| Language: | zh-TW |
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2018
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| Online Access: | http://ndltd.ncl.edu.tw/handle/4qv422 |