Design and Optimization of HVPMOS Devices and Hot Carrier Reliability Test with 90nm BCD Technology
碩士 === 亞洲大學 === 資訊工程學系 === 106 === In this thesis, Asymmetric and Symmetric High Voltage PMOS devices based on 90nm BCD(Bipolar-CMOS-DMOS) technology had been studied.BCD technology incorporates analog components on a single die.by integrating three distinct typed of components on a single die, thi...
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| Format: | Others |
| Language: | en_US |
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2017
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| Online Access: | http://ndltd.ncl.edu.tw/handle/2hf67q |