半導體結構分析與高階DB-FIB研究

碩士 === 逢甲大學 === 纖維與複合材料學系 === 107 === Due to the booming development of the semiconductor industry, the ability to judge the process of reverse engineering is becoming more and more important. The analysis method has been played from the initial fragmentation to the TEM(transmission electron microsc...

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Bibliographic Details
Main Author: 鄭君煜
Other Authors: 陳文正
Format: Others
Language:zh-TW
Published: 2019
Online Access:http://ndltd.ncl.edu.tw/handle/733ja7