Characteristics of Different Gate Spacers on Negative Capacitance HfZrO Film for Junctionless FET Application

碩士 === 逢甲大學 === 電子工程學系 === 107 === This work investigates the characteristics of different gate spacers on negative capacitance of ferroelectric HfZrO2 film of junctionless FET (JL-FET). This thesis is divided into two parts, the first part is to study the characteristics of ferroelectric HfZrO2 fil...

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Bibliographic Details
Main Authors: CHEN, WEI-CHIEH, 陳威榤
Other Authors: Ping-Chang Yang
Format: Others
Language:zh-TW
Published: 2019
Online Access:http://ndltd.ncl.edu.tw/handle/d8crxj