Fabrication of Nitride Thin Films by Co-Sputtering of High Entropy Alloys and Tungsten

碩士 === 龍華科技大學 === 機械工程系碩士班 === 107 === This work studies the co-deposition by DC-reactive magnetron sputtering of tungsten (W) coatings over soda glass and SUS 304 stainless steel substrates. A high entropy equimolar alloy (AlCrNbSiTiV) target (diameter 2 in) and a W target (diameter 3 in) were bomb...

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Main Authors: Chen, Yan Tong, 陳彥彤
Other Authors: Hsu, Chun-Yao
Format: Others
Language:zh-TW
Published: 2019
Online Access:http://ndltd.ncl.edu.tw/handle/fj4ax7
id ndltd-TW-107LHU00490024
record_format oai_dc
spelling ndltd-TW-107LHU004900242019-08-23T03:46:06Z http://ndltd.ncl.edu.tw/handle/fj4ax7 Fabrication of Nitride Thin Films by Co-Sputtering of High Entropy Alloys and Tungsten 高熵合金及鎢共濺鍍氮化物薄膜之研究 Chen, Yan Tong 陳彥彤 碩士 龍華科技大學 機械工程系碩士班 107 This work studies the co-deposition by DC-reactive magnetron sputtering of tungsten (W) coatings over soda glass and SUS 304 stainless steel substrates. A high entropy equimolar alloy (AlCrNbSiTiV) target (diameter 2 in) and a W target (diameter 3 in) were bombarded with Ar and N2 reactant gasses to form plasma. The N2/(Ar+N2) flow ratio (0, 5, 10, 15, 20%) was adjusted under a fixed sputtering power (200 W), a fixed reaction time (15 min), a fixed substrate temperature (150°C) and observed the influence of these parameters over the properties such as surface morphologies, hardness, wear resistance, surface roughness, corrosion resistance and microstructure such as grain sizes, crystalline structures and elemental contents of the sputtered films. From results it was seen that as N2/(Ar+N2) flow ratio increased, the structure of the films changed considerably, from a single W structure with low concentrations of the other elements to a W2N structure. When RN=20%, the best (AlCrNbSiTiV-W)N film was achieved. From XRD measurements of the high entropy alloy nitride compound, it was evident that at 2θ angle of 40° there was a major W (110) diffraction peak, displaying preference for columnar crystalline structures. SEM images showed homogeneous growth of the nitride layer, with dense structures, no cracking and grain-like structure. From EDS analyses, the nitrogen concentration was highest (39.3%) when N2/(Ar+N2) flow ratio was 20%. Moreover, W concentration had a tendency to decrease as N2/(Ar+N2) flow ratio increased. The smallest average grain size was D: 7.1 nm, the highest hardness was 37.52 GPa (682.3HV), and the highest Young’s modulus was E: 210.4 GPa. The lowest friction coefficient was 0.516, while the lowest surface roughness was Ra: 3 nm, and the best corrosion resistance observed was Ecorr: -221.6 mV/ Icorr: 0.793µAmp/cm2. Hsu, Chun-Yao 許春耀 2019 學位論文 ; thesis 59 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 龍華科技大學 === 機械工程系碩士班 === 107 === This work studies the co-deposition by DC-reactive magnetron sputtering of tungsten (W) coatings over soda glass and SUS 304 stainless steel substrates. A high entropy equimolar alloy (AlCrNbSiTiV) target (diameter 2 in) and a W target (diameter 3 in) were bombarded with Ar and N2 reactant gasses to form plasma. The N2/(Ar+N2) flow ratio (0, 5, 10, 15, 20%) was adjusted under a fixed sputtering power (200 W), a fixed reaction time (15 min), a fixed substrate temperature (150°C) and observed the influence of these parameters over the properties such as surface morphologies, hardness, wear resistance, surface roughness, corrosion resistance and microstructure such as grain sizes, crystalline structures and elemental contents of the sputtered films. From results it was seen that as N2/(Ar+N2) flow ratio increased, the structure of the films changed considerably, from a single W structure with low concentrations of the other elements to a W2N structure. When RN=20%, the best (AlCrNbSiTiV-W)N film was achieved. From XRD measurements of the high entropy alloy nitride compound, it was evident that at 2θ angle of 40° there was a major W (110) diffraction peak, displaying preference for columnar crystalline structures. SEM images showed homogeneous growth of the nitride layer, with dense structures, no cracking and grain-like structure. From EDS analyses, the nitrogen concentration was highest (39.3%) when N2/(Ar+N2) flow ratio was 20%. Moreover, W concentration had a tendency to decrease as N2/(Ar+N2) flow ratio increased. The smallest average grain size was D: 7.1 nm, the highest hardness was 37.52 GPa (682.3HV), and the highest Young’s modulus was E: 210.4 GPa. The lowest friction coefficient was 0.516, while the lowest surface roughness was Ra: 3 nm, and the best corrosion resistance observed was Ecorr: -221.6 mV/ Icorr: 0.793µAmp/cm2.
author2 Hsu, Chun-Yao
author_facet Hsu, Chun-Yao
Chen, Yan Tong
陳彥彤
author Chen, Yan Tong
陳彥彤
spellingShingle Chen, Yan Tong
陳彥彤
Fabrication of Nitride Thin Films by Co-Sputtering of High Entropy Alloys and Tungsten
author_sort Chen, Yan Tong
title Fabrication of Nitride Thin Films by Co-Sputtering of High Entropy Alloys and Tungsten
title_short Fabrication of Nitride Thin Films by Co-Sputtering of High Entropy Alloys and Tungsten
title_full Fabrication of Nitride Thin Films by Co-Sputtering of High Entropy Alloys and Tungsten
title_fullStr Fabrication of Nitride Thin Films by Co-Sputtering of High Entropy Alloys and Tungsten
title_full_unstemmed Fabrication of Nitride Thin Films by Co-Sputtering of High Entropy Alloys and Tungsten
title_sort fabrication of nitride thin films by co-sputtering of high entropy alloys and tungsten
publishDate 2019
url http://ndltd.ncl.edu.tw/handle/fj4ax7
work_keys_str_mv AT chenyantong fabricationofnitridethinfilmsbycosputteringofhighentropyalloysandtungsten
AT chényàntóng fabricationofnitridethinfilmsbycosputteringofhighentropyalloysandtungsten
AT chenyantong gāoshānghéjīnjíwūgòngjiàndùdànhuàwùbáomózhīyánjiū
AT chényàntóng gāoshānghéjīnjíwūgòngjiàndùdànhuàwùbáomózhīyánjiū
_version_ 1719236431617982464