Effects of materials characteristics on ultrasonic bonding for Cu/Cu microelectronic joints

碩士 === 國立中興大學 === 材料科學與工程學系所 === 107 === Due to the advantages of low electrical resistance and size miniaturization, Cu to Cu direct bonding has become one of the important trends in microelectric interconnect fabrication. However, strict processing requirements, e.g. high vacuum, long bonding tim...

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Bibliographic Details
Main Authors: I-Yu Yu, 俞亦祐
Other Authors: 宋振銘
Format: Others
Language:zh-TW
Published: 2019
Online Access:http://ndltd.ncl.edu.tw/cgi-bin/gs32/gsweb.cgi/login?o=dnclcdr&s=id=%22107NCHU5159057%22.&searchmode=basic