Reliability of Amorphous Si:H Thin-Film Transistors under Different Negative Bias Stress
碩士 === 國立中興大學 === 電機工程學系所 === 107 === Hydrogenated amorphous silicon thin-film transistors (a-Si:H TFTs) are widely used in different types of displays. Although its carrier mobility and reliability are not as good as polycrystalline silicon thin-film transistors (poly-Si TFTs), due to mature tech...
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| Format: | Others |
| Language: | zh-TW |
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2019
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| Online Access: | http://ndltd.ncl.edu.tw/cgi-bin/gs32/gsweb.cgi/login?o=dnclcdr&s=id=%22107NCHU5441043%22.&searchmode=basic |