Impact of Line-Edge-Roughness on Interconnect RC for Advanced Technology Nodes

碩士 === 國立成功大學 === 奈米積體電路工程碩士學位學程 === 107

Bibliographic Details
Main Authors: Fu-XiangLiang, 梁富翔
Other Authors: Darsen Lu
Format: Others
Language:en_US
Published: 2019
Online Access:http://ndltd.ncl.edu.tw/handle/tr2gt6