Measurements of refractive index of thin films by using Tamm plasmon
碩士 === 國立交通大學 === 光電系統研究所 === 107 === Tamm plasmon device is proposed by inserting a polyimide (PI) film between the metal film and the photonic crystal (PC). The resonance wavelength of the proposed Tamm plasmon device is studied while changing the thickness and refractive index of PI film. The ref...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2018
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| Online Access: | http://ndltd.ncl.edu.tw/handle/m9kr4p |