Firmware Emulation for Dynamic Analysis and Fuzz Testing
碩士 === 國立交通大學 === 資訊科學與工程研究所 === 107 === IoT devices have gradually become an indispensable part of our lives, but during the development, the related vulnerabilities has emerged. In various studies, we can see that IoT devices are with high risk, either from the network or information security cons...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2019
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/f939t2 |