Low-Capacitance and High-Reliable ESD Protection Designs in CMOS Technology

博士 === 國立交通大學 === 電子研究所 === 107 === With the continuous evolution of communication technology and integrated circuit (IC), wireless and wireline communication devices had become essential in daily life. All microelectronic products must meet the reliability specifications to be safely used and provi...

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Bibliographic Details
Main Authors: Chen, Jie-Ting, 陳界廷
Other Authors: Ker, Ming-Dou
Format: Others
Language:en_US
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/6m2xcc