FAE: Autoencoder-Based Failure Binning of RTL Designs for Verification and Debugging
碩士 === 國立交通大學 === 電機工程學系 === 107 === As the Register Transfer Level (RTL) designs are more complicated, debugging becomes a major bottleneck in the design process. To make debugging more efficient, failure binning aims at grouping failure traces caused by the same error source together so that desig...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2018
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| Online Access: | http://ndltd.ncl.edu.tw/handle/p4x648 |