Industrial Anomaly Inspection based on Neural Networks and Generative Adversarial Networks

碩士 === 國立交通大學 === 電控工程研究所 === 107

Bibliographic Details
Main Authors: Lai, Yu-Ting, 賴昱廷
Other Authors: Hu, Jwu-Sheng
Format: Others
Language:en_US
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/gx8ef6