Optimal Test Plans of Accelerated Destructive Degradation Models
碩士 === 國立中央大學 === 統計研究所 === 107 === Accelerated destructive degradation tests (ADDTs) are commonly used to assess the reliability information of one-shot products. The accuracy of the reliability inference can be affected by the settings of test plan, including model assumptions, measurement times,...
Main Authors: | , |
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Other Authors: | |
Format: | Others |
Language: | zh-TW |
Published: |
2018
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Online Access: | http://ndltd.ncl.edu.tw/handle/68p7vw |