Optimal Test Plans of Accelerated Destructive Degradation Models

碩士 === 國立中央大學 === 統計研究所 === 107 === Accelerated destructive degradation tests (ADDTs) are commonly used to assess the reliability information of one-shot products. The accuracy of the reliability inference can be affected by the settings of test plan, including model assumptions, measurement times,...

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Bibliographic Details
Main Authors: Chi-Hao Lan, 藍啟豪
Other Authors: 樊采虹
Format: Others
Language:zh-TW
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/68p7vw