Influence of ITO Annealing Temperature on the Optoelectronic Characteristics and Reliability of InGaN Light Emitting Diode Chips

碩士 === 國立彰化師範大學 === 光電科技研究所 === 107 === This thesis investigated the effects of thermal annealing temperatures of indium tin oxide (ITO) on the optoelectronic characteristics and reliability of InGaN blue light-emitting diodes (LEDs). The basic structures, optoelectronic characteristics and thermal...

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Bibliographic Details
Main Authors: Huang,Chun-Hsiang, 黃俊翔
Other Authors: Huang, Man-Fang
Format: Others
Language:zh-TW
Published: 2019
Online Access:http://ndltd.ncl.edu.tw/handle/s4a7v5