Using Stepped-Impedance Microstrip Lines for The Broadband Measurement of Substrate Dielectric Constant

碩士 === 國立高雄科技大學 === 電子工程系 === 107 === In this paper, an improved method is proposed for the broadband measurement of the dielectric constant of the microstrip substraste with two-microstrip-line method. This method uses the S-parameters measurement results of two different structures of the steppe...

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Bibliographic Details
Main Authors: SHEN, SHAO-JIE, 沈玿頡
Other Authors: HSU, YAO-WEN
Format: Others
Language:zh-TW
Published: 2019
Online Access:http://ndltd.ncl.edu.tw/handle/juszkm