Machine Vision 2 Dimensions and 3 Dimensions detection for semiconductor coating inspection
碩士 === 國立高雄科技大學 === 機械工程系 === 107 === This study is applied to semiconductor components and ceramic substrates by 2D and 3D machine vision inspection systems. In the past, the semiconductor machine inspection system used 2D for testing, but the technology is changing with each passing day, and many...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2019
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| Online Access: | http://ndltd.ncl.edu.tw/handle/s6re72 |