Wideband Conducted Electromagnetic Interference and Susceptibility Measurement Techniques for ICs
博士 === 國立清華大學 === 電子工程研究所 === 107 === This work focuses on the wideband measurement technique development of the conducted electromagnetic compatibility (EMC) for IC, and presents the chip level design strategies. For the electromagnetic interference (EMI) test, a 1-Ω probe is presented to comply wi...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2019
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| Online Access: | http://ndltd.ncl.edu.tw/handle/zc2ubt |