The Study of the Double Gate Schottky Barrier SiGe Charge Trapping Memories
碩士 === 國立清華大學 === 電子工程研究所 === 107
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2018
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/xq8y6w |