Suppressed Gate Leakage Current and Enhanced Gate Dielectric Reliability in FinFET

碩士 === 國立清華大學 === 工程與系統科學系 === 107

Bibliographic Details
Main Authors: Chen, Huang-Jen, 陳皇任
Other Authors: ChangLiao, Kuei-Shu
Format: Others
Language:zh-TW
Published: 2018
Online Access:http://ndltd.ncl.edu.tw/handle/wub55j