Automatic Optical Inspection for Millimeter Scale Probe Surface Stripping using Convolutional Neural Network
碩士 === 國立臺北大學 === 資訊工程學系 === 107 === Surface defect inspection is a crucial step during the production process of IC probe. The traditional way of identifying defective IC probes mostly re-lies on the human visual examination through the microscope screen. How-ever, this approach will be affected by...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2019
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| Online Access: | http://ndltd.ncl.edu.tw/handle/3cd5bc |