Study of Two-State Current Phenomenon due to Neighboring-Device Coupling Effect in MIS(p) Tunnel Diode

碩士 === 國立臺灣大學 === 電子工程學研究所 === 107 === In this thesis, the two-state phenomenon in current behavior of coupled MIS device with SiO2 as dielectric material is investigated. The coupled MIS device is separated to two parts. One is the inner circle MIS tunnel diode called Sensor MIS, and the other is o...

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Bibliographic Details
Main Authors: Yu-Cheng Chiang, 江育誠
Other Authors: Jenn-Gwo Hwu
Format: Others
Language:en_US
Published: 2019
Online Access:http://ndltd.ncl.edu.tw/handle/7g4bx9