Fabrication and Characterization of GeSn n+/p Diodes with High JON/JOFF Ratios

碩士 === 國立臺灣大學 === 電子工程學研究所 === 107 === Germanium-Tin (GeSn) alloys with a high carrier mobility are a promising channel material for next-generation CMOS technology. As the Sn fraction of GeSn alloysis higher than 8 ~ 11 %, GeSn becomes a direct-bandgap material, where more electrons would populate...

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Bibliographic Details
Main Authors: Jia-You Liu, 劉家佑
Other Authors: Jiun-Yun Li
Format: Others
Language:zh-TW
Published: 2019
Online Access:http://ndltd.ncl.edu.tw/handle/86cwcf