Thermal Expansion Behavior, Electrical Properties and Machinability of PbTiO3- Bi(Mg,Ti)O3 –based ferroelectric Ceramic System
碩士 === 國立臺灣科技大學 === 機械工程系 === 107 === Probe card plays an important role in the semiconductor device quality control test. It can reduce the quality check time drastically and increases yield up to 20%. This thesis studies and discusses the possibility of materials alteration to the guide plate cera...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2019
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| Online Access: | http://ndltd.ncl.edu.tw/handle/cqhcr8 |