Unsupervised Autoencoder for surface defect detection
碩士 === 元智大學 === 工業工程與管理學系 === 107 === Machine vision technology has been widely used in manufacturing for defect detection. Traditional machine vision needs to manually design features or indicators that can distinctly describe the surface texture and defect characteristics. It then uses high-dimens...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2019
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| Online Access: | http://ndltd.ncl.edu.tw/handle/63uq35 |