Conditional Generative Adversarial Network for Defect Classification with Class Imbalance
碩士 === 元智大學 === 資訊管理學系 === 107 === Automated Optical Inspection (AOI) is used for defect inspection during industrial manufacturing process. It uses optical instrument to snap the surface of products and identify defects through technique of machine vision processing. Deep learning and convolution n...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2019
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| Online Access: | http://ndltd.ncl.edu.tw/handle/gku365 |