Practical considerations for post-silicon debug using backspace
With the ever-increasing complexity of integrated circuits, the elimination of all design errors before fabrication is becoming more difficult. This increases the need to find design errors in chips after fabrication. This task, termed post-silicon debug, can be made easier if it is possible to ob...
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| Format: | Others |
| Language: | English |
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University of British Columbia
2009
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| Online Access: | http://hdl.handle.net/2429/12573 |