Crystal structure of spessartine and andradite at elevated temperatures
Single crystal x-ray intensity data have been collected with a manual diffractometer utilizing flat-cone geometry for a spessartine from Minas Gervais, Brazil at 25°, 350°, 575° and 850°C and for an andradite from Valmalen, Italy at 25°, 350°, 575° and 850°C. Weighted anisotropic least-squares refin...
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| Language: | English |
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2010
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| Online Access: | http://hdl.handle.net/2429/19304 |