Low temperature x-ray diffraction studies of TaS₂ and LixTiS₂
A low temperature x-ray powder diffraction attachment for use on the vertical goniometer of a diffractometer is described. We have found that diffraction patterns obtained with the attachment mounted on the goniometer are of comparable quality to those obtained on the goniometer itself. Using this a...
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| Language: | English |
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University of British Columbia
2010
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| Online Access: | http://hdl.handle.net/2429/24632 |