Experiments and simulations on negative/positive bias temperature instability in 28nm CMOS devices
CMOS transistors come with a scaling potential, which brings along challenges such as process variation and NBTI/PBTI (Negative/Positive Bias Temperature Instability). My objectives during this project are to investigate effects of aging on CMOS devices as well as to show experimental results in ord...
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| Language: | English |
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University of British Columbia
2015
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| Online Access: | http://hdl.handle.net/2429/55104 |