Electromagnetic Wave Scattering from a Rough Surface
University of Central Florida College of Engineering Thesis === This was a study to measure surface roughness using scattering of electromagnetic waves in the Ka and X microwave frequency bands. The detected fluctuations of the reflected field intensity is a measure of surface roughness. The refle...
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| Format: | Dissertation |
| Language: | English |
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University of Central Florida
1980
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| Online Access: | http://digital.library.ucf.edu/cdm/ref/collection/RTD/id/54700 |