Characterization of Dielectric Samples at Microwave Frequencies Using Substrate Integrated Waveguide Techniques
Complex permittivities of the materials are evaluated at microwave frequencies by using the Substrate Integrated Waveguide (SIW) cavity resonator and Epsilon Near Zero (ENZ) technology. Dielectric parameters such as dielectric constant and dielectric loss of solids samples, solvents and alcohols...
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| Format: | Others |
| Language: | in |
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Universidad de las Américas Puebla
2010
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| Online Access: | http://catarina.udlap.mx/u_dl_a/tales/documentos/lmt/martinez_b_j/ |