| Summary: | Complex permittivities of the materials are evaluated at microwave frequencies
by using the Substrate Integrated Waveguide (SIW) cavity resonator and Epsilon
Near Zero (ENZ) technology.
Dielectric parameters such as dielectric constant and dielectric loss of
solids samples, solvents and alcohols are determined by measuring the change
in the resonant frequency and in the Q factor, due to the introduction of
the samples in to these resonant structures.
High Frequency Structure Simulator (HFSS) has been used to design and optimize
the resonant structures.
Simulations and measurements are performed with different substrates and
different dielectric samples to validate the cavity perturbation theory using
substrate integrated waveguide (SIW) cavity resonator.
For ENZ structure, simulations are performed with various height ratios to
choose an optimized ratio that allows higher sensitivity.
Simulation and measurement results of cavity resonator and ENZ tunnel are
in good agreement with theoretical values. Both structures present low profile,
low cost, ease of fabrication and ease of integration, which adds important
characteristics for portable material measurement systems.
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