A study of the uses of scattered x-rays for internal standardization in x-ray spectroscopic analysis

Typescript. === Thesis (Ph. D.)--University of Hawaii, 1970. === Bibliography: leaves 183-192. === xiii, 192 l illus., graphs, tables

Bibliographic Details
Main Author: Taylor, David LeRoy
Language:en-US
Published: [Honolulu] 2009
Subjects:
Online Access:http://hdl.handle.net/10125/11419