A study of the uses of scattered x-rays for internal standardization in x-ray spectroscopic analysis
Typescript. === Thesis (Ph. D.)--University of Hawaii, 1970. === Bibliography: leaves 183-192. === xiii, 192 l illus., graphs, tables
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Language: | en-US |
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[Honolulu]
2009
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Online Access: | http://hdl.handle.net/10125/11419 |