Analysis of electronic specialty gases by sealed inductively coupled plasma-atomic emission spectrometry (SICP-AES)

The Sealed Inductively Coupled Plasma Atomic Emission Spectrometer (SICP-AES) was developed for toxic and reactive gas analysis. The most important challenge in using this technique routinely to determine the metallic impurities in toxic and reactive gases is calibrating the system for metals such a...

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Bibliographic Details
Main Author: Tepe, Reha Kadir
Language:ENG
Published: ScholarWorks@UMass Amherst 1999
Subjects:
Online Access:https://scholarworks.umass.edu/dissertations/AAI9920658