Novel Method for Broadband On-Chip Noise Characterization
A novel method for on-chip noise characterization of mm-wave circuits is presented. Different available methods for noise measurements and requirements for on-chip noise mea-surements are studied. The Y-factor method is chosen to be the more suitable method for in-situ applications since it does not...
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| Format: | Others |
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ScholarWorks@UMass Amherst
2014
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| Online Access: | https://scholarworks.umass.edu/masters_theses_2/132 https://scholarworks.umass.edu/cgi/viewcontent.cgi?article=1126&context=masters_theses_2 |