Global Interconnects in the Presence of Uncertainty
Global interconnect reliability is becoming a bigger issue as we scale down further into the submicron regime. As transistor dimensions get smaller, variations in the manufacturing process, and temperature variations may cause undesired behavior, and as a result, compromise performance. This work...
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| Format: | Others |
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ScholarWorks@UMass Amherst
2008
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| Online Access: | https://scholarworks.umass.edu/theses/85 https://scholarworks.umass.edu/cgi/viewcontent.cgi?article=1125&context=theses |