Setup of pulsed IV system and characterization of magnetic nanocontacts and microwires
The development of resistance measurement techniques is very important for characterization of future nanoelectronics. Pulsed IV measurement techniques are very useful for accurate resistance measurements on nanoscale samples because of the efficient removal of e.g. EMF errors. In the project we hav...
| Main Authors: | , |
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| Format: | Others |
| Language: | English |
| Published: |
Högskolan i Halmstad, Sektionen för Informationsvetenskap, Data– och Elektroteknik (IDE)
2011
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| Subjects: | |
| Online Access: | http://urn.kb.se/resolve?urn=urn:nbn:se:hh:diva-16523 |