Core Switching Noise for On-Chip 3D Power Distribution Networks
Reducing the interconnect size with each technology node and increasing speed with each generation increases IR-drop and Ldi/dt noise. In addition to this, the drive for more integration increases the average current requirement for modern ULSI design. Simultaneous switching of core logic blocks and...
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| Format: | Doctoral Thesis |
| Language: | English |
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KTH, Elektroniksystem
2012
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| Online Access: | http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-103566 http://nbn-resolving.de/urn:isbn:978-91-7501-519-4 |