Imaging materials with intermodulation : Studies in multifrequency atomic force microscopy
The Atomic Force Microscope (AFM) is a tool for imaging surfaces at the microand nano meter scale. The microscope senses the force acting between a surfaceand a tip positioned at the end of a micro-cantilever, forming an image of the surface topography. Image contrast however, arises not only from s...
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| Format: | Doctoral Thesis |
| Language: | English |
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KTH, Nanostrukturfysik
2015
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| Online Access: | http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-159689 http://nbn-resolving.de/urn:isbn:978-91-7595-437-0 |