Development of a CNC Milling System for Preparation of Micrometer-Sized Samples for X-ray Nanotomography
X-ray nanotomography is an imaging technique used to study three-dimensional structures at submicrometer length scale. The samples to be studied should be only 10s of micrometers in diameter, and ideally cylindrical. Focused ion beam milling is the most common technique used to prepare samples for...
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| Format: | Others |
| Language: | English |
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KTH, Tillämpad fysik
2021
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| Online Access: | http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-298611 |