Atom Probe Tomography of TiSiN Thin Films

This thesis concerns the wear resistant coating TiSiN and the development of the analysis technique atom probe tomography (APT) applied to this materials system. The technique delivers compositional information through time-of-flight mass spectrometry, with sub-nanometer precision in 3D for a small...

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Bibliographic Details
Main Author: Engberg, David
Format: Others
Language:English
Published: Linköpings universitet, Tunnfilmsfysik 2015
Subjects:
Online Access:http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-122724
http://nbn-resolving.de/urn:isbn:978-91-7685-901-8