Placement of measurement points for wear-out prediction with regard to electromigration

Nowadays, electronic systems are widely used in applications such as mobile phones, laptops, etc., but the electronic systems are not permanent and indestructible, so the reliability of an electronic system is a major concern. However, the lifetime of electronic systems are shorter than it was 40 ye...

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Bibliographic Details
Main Author: Chang, Shih-Yen
Format: Others
Language:English
Published: Linköpings universitet, ESLAB - Laboratoriet för inbyggda system 2010
Subjects:
Online Access:http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-57751