Stimuli Generation Techniques for On-Chip Mixed-Signal Test
With increased complexity of the contemporary very large integrated circuits the need for onchip test addressing not only the digital but also analog and mixed-signal RF blocks has emerged. The standard production test has become more costly and the instrumentation is pushed to its limits by the lea...
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| Format: | Doctoral Thesis |
| Language: | English |
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Linköpings universitet, Elektroniska komponenter
2010
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| Online Access: | http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-61712 http://nbn-resolving.de/urn:isbn:978-91-7393-288-2 |